A cornerstone in the study of both natural and technological materials is characterisation of microstructure. In the widest sense this topic encompasses, for all phases present, morphology, chemical composition and crystallography. Until the last part of the twentieth century these aspects of microstructural characterisation were measured separately, as dictated by available technology. A landmark advance for the materials community occurred with the genesis of ‘microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. A definition of microtexture is ‘a population of crystallographic orientations whose individual components are linked to their location within the microstructure.'
An estimated 95% of microtexture determination is by ‘electron backscatter diffraction' (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Essentially, a stationary beam of electrons is diffracted by atomic planes in the sampled volume of specimen. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an ‘orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents.
EBSD is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. For the first time a wealth of information on topics relating to, for example, orientation distribution (texture), processing history, microstructure evolution, interfaces and structure/property links is now routinely accessible. Microtexture analysis can in principle be applied to any crystalline material, subject to suitable specimen preparation.
In this talk we describe fundamental aspects of materials characterisation by EBSD and orientation mapping, supported by examples. In addition, some exciting new applications of EBSD to grain boundary characterisation will be presented, whereby all five degrees of freedom of the grain boundary (both the misorientation and the boundary plane) are measured. |